The Efficient TAM Design for Core-Based SOCs Testing
學年 97
學期 1
出版(發表)日期 2008-11-01
作品名稱 The Efficient TAM Design for Core-Based SOCs Testing
著者 Rau, Jiann-chyi; Wu, Po-han; Chien, Chih-lung; Wu, Chien-hsu
單位 淡江大學電機工程學系
出版者 Athens: World Scientific and Engineering Academy and Society (W S E A S)
著錄名稱、卷期、頁數 WSEAS Transactions on Circuits And Systems 11(7), pp.922-931
摘要 This paper presents a framework and an efficient method to determine SOC test schedules. We increase the test TAM widths by the framework. Our method deals with the traditional scan chains and reconfigurable multiple scan chains. Experimental results for ITC’02 SOC TEST Benchmarks show that we obtain better test application time when compared to previously published algorithms. Test access mechanism (TAM) and test schedule for System-On-chip (SOC) are challenging problems. Test schedule must be effective to minimize testing time, under the constraint of test resources. This paper presents a core section method based on generalized 2-D rectangle packing. A core cuts into many pieces and utilizes the design of reconfigurable core wrappers, and is dynamic to change the width of the TAM executing the core test. Therefore, a core can utilize different TAM width to complete test.
關鍵字 SOC Testing;TAM;Testing Scheduling
語言 en
ISSN 1109-2734
收錄於 EI
審稿制度 國外
國別 GRC
出版型式 紙本

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