X-ray-absorption spectroscopy of CoSi2
學年 84
學期 2
出版(發表)日期 1996-06-01
作品名稱 X-ray-absorption spectroscopy of CoSi2
作品名稱(其他語言) CoSi2的X-ray吸收光譜研究
著者 Pong, Way-faung; Chang, Y. K.; Mayanovic, R. A.; Ho, G. H.; Lin, H. J.; Ko, S. H.; Tseng, P. K.; Chen, C. T.; Hirya, A.; Watanabe, M.
單位 淡江大學物理學系
出版者 College Park: American Physical Society (APS)
著錄名稱、卷期、頁數 Physical Review B 53(24), pp.16510-16515
摘要 X-ray-absorption near-edge structure (XANES) spectra of thin-film CoSi2 were measured at the Si K edge and Co L3 edge using the total electron yield mode. The Si K-edge results for CoSi2 showed a dramatic reduction of intensity in the first broad feature accompanied by a rise in a relatively strong and sharp feature at higher binding energies when compared to XANES spectra for crystalline Si. We attribute these two features to the Si 1s photoelectron excitations to a broad Si 3p nonbonding band and a relatively narrow band of hybridized Si p–Co 3d antibonding states, respectively. Analysis of the Co L3-edge white line spectra for CoSi2 reveals the appearance of a triple structure, which can be attributed to excitations to the unoccupied Co 3d nonbonding states and hybridized antibonding Co (3d,4s)–Si p states.
關鍵字
語言 en
ISSN 0163-1829 1095-3795
期刊性質
收錄於
產學合作
通訊作者 Ko, S. H.
審稿制度
國別 USA
公開徵稿
出版型式 紙本 電子版
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