| 標題：Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy |
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| 學年 | 87 |
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| 學期 | 2 |
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| 出版（發表）日期 | 1999/05/01 |
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| 作品名稱 | Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy |
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| 作品名稱（其他語言） | |
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| 著者 | Pong, W. F.; Liou, Y. C.; Chang, K. H.; Tsai, M. H.; Hsieh, H. H.; Chang, Y. K.; Tseng, P. K. |
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| 單位 | 淡江大學物理學系 |
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| 出版者 | Malden: Wiley-Blackwell Publishing, Inc. |
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| 著錄名稱、卷期、頁數 | Journal of synchrotron radiation 6(3), pp.746-748 |
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| 摘要 | We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40A)/Ct (t~) (t~ = 2, 3, 5, 7, and 9A) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hcp structure when the thickness of the Cr layer is decreased down to -5A or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results. |
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| 關鍵字 | |
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| 語言 | 英文 |
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| ISSN | 0909-0495 |
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| 期刊性質 | 國外 |
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| 收錄於 | |
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| 產學合作 | |
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| 通訊作者 | |
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| 審稿制度 | |
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| 國別 | 美國 |
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| 公開徵稿 | |
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| 出版型式 | 紙本;電子版 |
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| 相關連結 | |
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