教師資料查詢 | 類別: 期刊論文 | 教師: 鄭伯昆 TSENG POH-KUN (瀏覽個人網頁)

標題:Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator
學年86
學期2
出版(發表)日期1998/05/01
作品名稱Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator
作品名稱(其他語言)
著者Hwang, C. S.; Fan, T. C.; Lin, F. Y.; Yeh, Shuting; Chang, C. H.; Chen, H. H.; 鄭伯昆; Tseng, P. K.
單位淡江大學物理學系
出版者International Union of Crystallography
著錄名稱、卷期、頁數Journal of Synchrotron Radiation 5(3), pp.471-474
摘要link to html
Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator


C.-S. Hwang, T. C. Fan, F. Y. Lin, S. Yeh, C. H. Chang, H. H. Chen and P. K. Tseng
A three-orthogonal-Hall-probe assembly with an `on the fly' mapping method has been developed to characterize an elliptically polarizing undulator (EPU). The underlying design concept is that it can measure the three real field components without any field correction under a reliable and synchronization measurement method. Therefore, the relative central position shift, orthogonal angle and the planar Hall effect error between the three Hall probes should be calibrated and readjusted. Experimental results demonstrate that this method can yield an r.m.s. reproducibility of 10 G cm for the three field components and 2 G for the peak field strength. Under precision conditions this system can completely measure the three on-axis field components within 2 min for a 4 m-long EPU.
關鍵字elliptically polarizing undulators;three-orthogonal-Hall-probe assembly;planar Hall effect
語言英文
ISSN0909-0495;1600-5775
期刊性質國外
收錄於
產學合作
通訊作者
審稿制度
國別英國
公開徵稿
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