教師資料查詢 | 類別: 期刊論文 | 教師: 彭維鋒 Pong, Way-faung (瀏覽個人網頁)

標題:Electronic structure of aligned carbon nanotubes studied by scanning photoelectron microscopy
學年91
學期2
出版(發表)日期2003/03/01
作品名稱Electronic structure of aligned carbon nanotubes studied by scanning photoelectron microscopy
作品名稱(其他語言)
著者Hong, I. H.; Chiou, J. W.; Wang, S. C.; Klauser, R.; 彭維鋒; Pong, W. F.; Chen, L. C.; Chuang, T. J.
單位淡江大學物理學系
出版者EDP Sciences
著錄名稱、卷期、頁數Journal de physique IV 104, pp.467-470
摘要Focused x-rays on insulating layers produce local charges and the local charges result in kinetic energy shift in photoelectron spectra. In our study, when the thickness of the insulating layers was in the range of micrometer, the amount of kinetic energy shift initially increased within seconds to a value depending on the thickness and chemical composition of the insulator. The amount of energy shift stayed at the same value as long as the insulator was resistant to radiation damage. When the insulator was susceptible to radiation damage, then the amount of energy shift decreased as a function of time. The main cause of this decrease is attributed to conductivity increase due to chemical state change at the x-ray exposed volume of the insulator. The implication of the results is that scanning photoelectron microscopy (SPEM) can be applied for investigation of microstructures containing insulating materials; for example, SPEM can be used for depth-probe conducting microstructures embedded in micrometer-thick insulating layers. This study was performed with a SPEM at the Pohang Light Source, with an x-ray intensity at the focused area of ~10 9 photons/(s. m 2).
關鍵字
語言英文
ISSN1155-4339
期刊性質國內
收錄於
產學合作
通訊作者
審稿制度
國別中華民國
公開徵稿
出版型式,電子版
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