期刊論文
| 學年 | 113 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2025-03-21 |
| 作品名稱 | Thermal annealing-induced phase transition and optical property modulation of InxSe80-xTe20 thin film |
| 作品名稱（其他語言） | |
| 著者 | Pandian Mannu; V. S. Manikandan; Karthikeyan Kandhasamy; Gokul Bangaru; Matheswaran Palanisamy; Arun Thirumurugan; Asokan Kandasami; Chi-Liang Chen; Chung-Li Dong |
| 單位 | |
| 出版者 | |
| 著錄名稱、卷期、頁數 | Journal of Materials Science: Materials in Electronics 36, 508 |
| 摘要 | This study elucidates the impact of thermal annealing on the structural and optical properties of InxSe80−xTe20 thin films. The thermal treatment induces a remarkable amorphous-to-polycrystalline phase transition, characterized by the emergence of InSe and InSeTe phases. Differential Scanning Calorimetry (DSC) reveals critical glass transition and crystallization temperatures, providing insights into the thermodynamics of these chalcogenide systems. X-ray diffraction analyses confirm the amorphous nature of as-deposited films and their transformation to polycrystalline structures upon annealing. Microscopic investigations demonstrate significant surface modifications upon annealing treatment, further corroborating the crystallization behavior. Optical studies unveil annealing-dependent variations in absorption coefficient, extinction coefficient, and bandgap energy, which decrease as annealing temperature increases. This comprehensive investigation not only enhances our understanding of phase transitions in metal chalcogenides but also highlights the potential of these materials for emerging technologies, particularly in the field of phase change memory and optical data storage devices. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 1573-482X; 0957-4522 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 是 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | ,電子版,紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/129532 ) |