會議論文
| 學年 | 106 |
|---|---|
| 學期 | 2 |
| 發表日期 | 2018-06-24 |
| 作品名稱 | Minimizing write amplification to enhance lifetime of large-page flash-memory storage devices |
| 作品名稱（其他語言） | |
| 著者 | Wei-Lin Wang; Tseng-Yi Chen; Yuan-Hao Chang; Hsin-Wen Wei; Wei-Kuan Shih |
| 作品所屬單位 | |
| 出版者 | |
| 會議名稱 | Design Automation Conference, DAC 2018 |
| 會議地點 | San Francisco, CA |
| 摘要 | Due to the decreasing endurance of ƒash chips, the lifetime of ƒash drives has become a critical issue. To resolve this issue, various techniques such as wear-leveling and error correction code have been proposed to reduce the bit error rates of ƒash storage devices. In contrast to these techniques, we observe that minimizing write ampli€cation is another promising direction to enhance the lifetime of a ƒash storage device. However, the development trend of large-page ƒash memory exacerbates the write ampli€cation issue. In this work, we present a compression-based management design to deal with compressed data updates and internal fragmentation in ƒash pages. ‘us, it can minimize write ampli€cation by only updating the modi- €ed part of ƒash pages with the support of data reduction techniques; and the reduced write ampli€cation degree is more signi€cant when the ƒash page size becomes larger due to the development trend. ‘is design is orthogonal to wear-leveling and error correction techniques and thus can cooperate with them to further enhance the lifetime of a ƒash device. Based on a series of experiments, the results demonstrate that the proposed design can e‚ectively improve the lifetime of a ƒash storage device by reducing write ampli€cation. |
| 關鍵字 | Compression-based FTL; large ƒash page; ƒash lifetime |
| 語言 | en |
| 收錄於 | |
| 會議性質 | 國際 |
| 校內研討會地點 | 無 |
| 研討會時間 | 20180624~20180628 |
| 通訊作者 | |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | |
| 出處 | In the proceedings of DAC 116:1-116:6 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/114977 ) |