期刊論文
| 學年 | 89 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2000-10-01 |
| 作品名稱 | Structural characterization of the Co/Cr multilayers by x-ray-absorption spectroscopy |
| 作品名稱（其他語言） | |
| 著者 | Liou, Y. H.; Pong, Way-faung; Tsai, M.-H.; Chang, K. H.; Hseih, H. H.; Chang, Y. K.; Chien, F. Z.; Tseng, P. K.; Lee, J. F.; Liou, Y.; Huang, J. C. A. |
| 單位 | 淡江大學物理學系 |
| 出版者 | College Park: American Physical Society |
| 著錄名稱、卷期、頁數 | Physical Review B (Condensed Matter and Materials Physics) 62(14), pp.9616-9620 |
| 摘要 | We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co(11¯00) (40 Å)/Cr(211) (tCr) (tCr=2, 3, 5, 7, and 9 Å) multilayers. The Cr K x-ray-absorption near-edge fine structure (XANES) spectra of the Co/Cr multilayers indicate an abrupt transition of the Cr layer from hcp to bcc structure when the thickness of the Cr layer is increased to exceed ∼5 Å or three atomic layers. Our results offer an upper limit for the ability of the Co/Cr interface to stabilize the hcp structure in the thin Cr layer. The numbers of nearest-neighbor and next-nearest-neighbor atoms in the Cr and Co layers determined by extended x-ray-absorption fine-structure measurements performed at the Cr and Co K edge, respectively, are consistent with the XANES results. |
| 關鍵字 | chromium;cobalt;absorption;absorption spectroscopy;atom;chemical structure;structure analysis;thickness;X ray analysis |
| 語言 | en |
| ISSN | 1098-0121 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | 紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/19553 ) |