期刊論文
學年 | 101 |
---|---|
學期 | 2 |
出版(發表)日期 | 2013-03-01 |
作品名稱 | Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data |
作品名稱(其他語言) | |
著者 | Lee, Hsiu-Mei; Wu, Jong-Wuu; Lei, Chia-Ling |
單位 | 淡江大學統計學系 |
出版者 | Piscataway: Institute of Electrical and Electronics Engineers |
著錄名稱、卷期、頁數 | IEEE Transactions on Reliability 62(1), pp.296-304 |
摘要 | Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures. |
關鍵字 | Hypothesis testing procedure; lifetime performance index; maximum likelihood estimator; step-stress accelerated life test; type II right censored data |
語言 | en_US |
ISSN | 1558-1721 |
期刊性質 | 國外 |
收錄於 | SCI |
產學合作 | |
通訊作者 | Lee, Hsiu-Mei |
審稿制度 | 是 |
國別 | USA |
公開徵稿 | |
出版型式 | ,電子版,紙本 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/88824 ) |