期刊論文
| 學年 | 100 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 1912-01-01 |
| 作品名稱 | Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data |
| 作品名稱（其他語言） | |
| 著者 | Wei, Duan; Chen, C.Y. |
| 單位 | 淡江大學財務金融學系 |
| 出版者 | |
| 著錄名稱、卷期、頁數 | IEEE Tran. reliability R32(5), pp.492-495 |
| 摘要 | The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using Monte Carlo simulation. The power of these statistics is investigated with respect to several alternatives. For testing small sample s- normality, two of them, namely, the newly proposed Lilliefors type statistic and sample skewness coefficient have very good power. |
| 關鍵字 | Power comparison;Goodness-of-fit test statistic;Gaussian distribution;Exponential distribution |
| 語言 | en |
| ISSN | |
| 期刊性質 | 國內 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 否 |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72514 ) |