期刊論文

學年 98
學期 2
出版(發表)日期 2010-07-01
作品名稱 Measuring Technological Diversification: Identifying the Effects of Patent Scale and Patent Scope
作品名稱(其他語言) 量測技術多角化:探析專利規模與範疇的效果
著者 Chen, Jennifer H.; Jang, Show-Ling; Wen, Sonya H.
單位 淡江大學企業管理學系
出版者 Budapest: Akademiai Kiado Rt.
著錄名稱、卷期、頁數 Scientometrics 84(1), pp.265-275
摘要 Although technological diversification is an important strategic decision for both large and small firms alike, the conventional method of measuring such diversification may well introduce significant scale bias against small- and medium-sized firms. We examine this issue in this study using a sample of 73 Taiwanese integrated-circuit (IC) design firms covering the period from 1995 to 2007 and conclude that the conventional measure of technological diversification reflects the spread or distribution amongst technology classes of a company’s current technology portfolio, and does not capture the incremental expansion in technological scope, or the ‘dynamic act of diversification’, as reflected in our alternative scope measure. Our results suggest clear constraints on the applications made under the conventional index, particularly for firms with small patent scale.
關鍵字 Technological diversification; Patent scope; IC design firms
語言 en
ISSN 1588-2861 0138-9130
期刊性質 國外
收錄於 SCI SSCI
產學合作
通訊作者 Chen, Jennifer H.
審稿制度
國別 HUN
公開徵稿
出版型式 紙本
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