期刊論文
| 學年 | 94 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2006-01-01 |
| 作品名稱 | Evanescent microwave probe study on dielectric properties of materials |
| 作品名稱（其他語言） | |
| 著者 | Cheng, Hsiu-fung; 陳宜君; Chen, Yi-chun; 林諭男; Lin, I-nan |
| 單位 | 淡江大學物理學系 |
| 出版者 | Elsevier |
| 著錄名稱、卷期、頁數 | Journal of the European Ceramic Society 26(10-11), pp.1801-1805 |
| 摘要 | A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution. |
| 關鍵字 | Dielectric properties;Impurities;Surfaces;Evanescent microwave microscopy |
| 語言 | en |
| ISSN | 0955-2219 |
| 期刊性質 | 國內 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 否 |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27660 ) |