期刊論文

標題 Atomic Force Microscopy Study of E99P69E99 Triblock Copolymer Chains on Silicon Surface
學年 88
學期 1
出版(發表)日期 2000/01/25
作品名稱 Atomic Force Microscopy Study of E99P69E99 Triblock Copolymer Chains on Silicon Surface
作品名稱(其他語言)
著者 吳俊弘; Wu, Chunhung; Liu, T.; White, H.; Chu, B.
單位 淡江大學化學學系
出版者 American Chemical Society (ACS)
著錄名稱、卷期、頁數 Langmuir 16(2), pp.656-661
摘要 Atomic force microscopy (AFM) was employed to study the formation of Pluronic Polyol F127 oxyethylene99−oxypropylene69−oxyethylene99 (E99P69E99) triblock copolymer micelles on surface-treated silicon substrates. The micellar size determined by dynamic light scattering and small-angle X-ray scattering techniques was 20−30 nm. The two-dimensional micelle size measured by ambient AFM on the modified silicon surfaces was somewhat distorted (20−50 nm in the xy dimension and ∼7 nm in the z dimension) under the environmental conditions present during scanning (i.e., copolymer chain collapsing in air and AFM tip distortion during scanning). Surface treatment was more important than solution concentration for micelle formation on the silicon surfaces. The results could be correlated with the effect of inner capillary surface coating on the resolution of double-stranded DNA capillary electrophoresis by using E99P69E99/1X TBE buffer as the separation medium.
關鍵字
語言 英文
ISSN 0743-7463
期刊性質 國內
收錄於
產學合作
通訊作者
審稿制度
國別 中華民國
公開徵稿
出版型式 ,電子版