專利
| 學年期 | 標題 | Sdgs | 更新時間 |
|---|---|---|---|
| 103 / 2 | Device and method for measuring distribution of atomic resolution deformation | 2017-08-08 | |
| 104 / 2 | System and Method for Measuring Distribution of Deformation using Atomic Force | 2017-08-08 |
| 學年期 | 標題 | Sdgs | 更新時間 |
|---|---|---|---|
| 103 / 2 | Device and method for measuring distribution of atomic resolution deformation | 2017-08-08 | |
| 104 / 2 | System and Method for Measuring Distribution of Deformation using Atomic Force | 2017-08-08 |