301 |
100-2
|
教學計畫表
|
電機系電資三:硬體描述語言 TETAB3E2357 0A
|
302 |
100-2
|
教學計畫表
|
電機系電機三:微處理機實驗 TETCB3E1565 0B
|
303 |
101-1
|
教學計畫表
|
電機系電資三:作業系統 TETAB3E0175 0A
|
304 |
100-2
|
教學計畫表
|
電機系電資一:資訊概論 TETAB1E1034 2R
|
305 |
100-1
|
研究獎勵
|
Optimal Test Access Mechanism (TAM) for Reducing Test Application Time of Core-Based SOCs
|
306 |
100-1
|
研究獎勵
|
Power-Aware Multi-Chains Encoding Scheme for System-on-a-chip in Low-Cost Environment
|
307 |
100-1
|
研究獎勵
|
An Efficient Algorithm to Selectively Gate Scan Cells for Capture Power Reduction
|
308 |
101-1
|
論文指導
|
電機一電路組 林承瀚
|
309 |
101-1
|
論文指導
|
電機一機器人 陳昱璇
|
310 |
101-1
|
論文指導
|
電機一碩專班 陳威豪
|
311 |
100-1
|
研究報告
|
低捕捉功率快速掃描測試架構之研究
|
312 |
94-1
|
會議論文
|
智慧型無線光導盲杖導引系統暨導盲機器人之設計
|
313 |
97-1
|
會議論文
|
An Efficient Scheduling Algorithm for Testing SOC with Multi-Frequency TAM
|
314 |
98-1
|
會議論文
|
A Novel Gated Scan-Cell Scheme for Low Capture Power (LCP) in At-Speed Testing
|
315 |
92-1
|
會議論文
|
A Datapath-Based Debugging Mechanism for RTL Description
|
316 |
96-2
|
會議論文
|
A New Double-edge Triggered Design with Low-power consumption and High-speed
|
317 |
98-1
|
會議論文
|
A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
|
318 |
95-2
|
會議論文
|
A New Algorithm for Latch-Up Check Based on Look-Up Table
|
319 |
98-2
|
會議論文
|
Multi-Cycle Compress Technique for High-Speed IP in Low-Cost Environment
|
320 |
95-1
|
會議論文
|
Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs
|
321 |
99-1
|
會議論文
|
An Filling Methodology for Efficient Compaction of Test Responses with Unknowns
|
322 |
97-2
|
會議論文
|
Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
|
323 |
98-2
|
會議論文
|
Multi-Chains Encoding Scheme in Low-Cost ATE
|
324 |
97-2
|
會議論文
|
A Novel Constructive Data Compression Scheme for Shifting-in Power Reduction with Multiple Scan-chains Design
|
325 |
97-2
|
會議論文
|
A Novel Clock Gating Scheme of Scan Chains for Capture Power Reduction
|
326 |
96-1
|
會議論文
|
A Novel High-Speed SOC Test Scheme Using Virtual TAMs
|
327 |
96-2
|
會議論文
|
An Efficient Test-Data Compaction for Low Power VLSI Testing
|
328 |
97-1
|
會議論文
|
Test Slice Difference Technique for Low Power Testing
|
329 |
97-1
|
會議論文
|
The Grid-Based Two-Layer Routing Algorithm Suitable for Cell/IP-Based Circuit Design
|
330 |
99-2
|
期刊論文
|
Power-aware compression scheme for multiple scan-chain
|