關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Soft X-ray characterization of Zn1-xSnxOy electronic structure for thin film photovoltaics

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序號 學年期 教師動態
1 100/2 物理系 張經霖 教授 期刊論文 發佈 Soft X-ray characterization of Zn1-xSnxOy electronic structure for thin film photovoltaics , [100-2] :Soft X-ray characterization of Zn1-xSnxOy electronic structure for thin film photovoltaics期刊論文Soft X-ray characterization of Zn1-xSnxOy electronic structure for thin film photovoltaicsMukes Kapilashrami; Coleman X. Kronawitter; Tobias Törndahl; Johan Lindahl; Adam Hultqvist; Wei-Cheng Wang; Chang, Ching-Lin; Samuel S. Mao; Jinghua Guo淡江大學物理學系Cambridge: R S C PublicationsPhysical Chemistry Chemical Physics 14, pp.10154-10159Zinc tin oxide (Zn1−xSnxOy) has been proposed as an alternative buffer layer material to the toxic, and light narrow-bandgap CdS layer in CuIn1−x,GaxSe2 thin film solar cell modules. In this present study, synchrotron-based soft X-ray absorption and emission spectroscopies have been employed to probe the densities of states of intrinsic ZnO, Zn1−xSnxOy and SnOx thin films grown by atomic layer deposition. A distinct variation in the bandgap is observed with increasing Sn concentration, which has been confirmed independently by combined ellipsometry-reflectometry meas
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