關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Reliability sampling plans for Weibull distribution with limited capacity of test facility

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1 97/1 統計系 吳碩傑 教授 期刊論文 發佈 Reliability sampling plans for Weibull distribution with limited capacity of test facility , [97-1] :Reliability sampling plans for Weibull distribution with limited capacity of test facility期刊論文Reliability sampling plans for Weibull distribution with limited capacity of test facility蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye淡江大學統計學系Acceptance sampling;Posterior distribution;Prior distribution;Type II censoring;Warranty policyElsevierComputers and Industrial Engineering 55(3), pp.721-728This paper establishes reliability sampling plans for the Weibull lifetime distribution based on type II censored data with limited capacity of test facility. The products are sold under a general rebate warranty policy. It is also assumed that the shape parameter of the lifetime distribution is known, and the scale parameter is a random variable varying from lot to lot. A cost model is established which contains the cost per unit on test, the cost per unit time for life test, and the costs of rejecting and accepting a unit. An algorithm for determining the optimal reliability sampling pl
2 97/1 統計系 蔡宗儒 教授 期刊論文 發佈 Reliability sampling plans for Weibull distribution with limited capacity of test facility , [97-1] :Reliability sampling plans for Weibull distribution with limited capacity of test facility期刊論文Reliability sampling plans for Weibull distribution with limited capacity of test facility蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye淡江大學統計學系Acceptance sampling;Posterior distribution;Prior distribution;Type II censoring;Warranty policyElsevierComputers and Industrial Engineering 55(3), pp.721-728This paper establishes reliability sampling plans for the Weibull lifetime distribution based on type II censored data with limited capacity of test facility. The products are sold under a general rebate warranty policy. It is also assumed that the shape parameter of the lifetime distribution is known, and the scale parameter is a random variable varying from lot to lot. A cost model is established which contains the cost per unit on test, the cost per unit time for life test, and the costs of rejecting and accepting a unit. An algorithm for determining the optimal reliability sampling pl
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