關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Power-aware compression scheme for multiple scan-chain

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序號 學年期 教師動態
1 99/2 電機系 吳柏翰 助理教授 期刊論文 發佈 Power-aware compression scheme for multiple scan-chain , [99-2] :Power-aware compression scheme for multiple scan-chain期刊論文Power-aware compression scheme for multiple scan-chainRau, Jiann-Chyi; Wu, Po-Han淡江大學電機工程學系scan based testing; low power testing; test data compression; design for testability (DfT)Abingdon: Taylor & Francis Ltd.Journal of the Chinese Institute of Engineers 34(4), pp.515-527As test data continues to grow quickly, test cost also increases. For the sake of decreasing the test cost, this article presents a new data dependency compression scheme for large circuit which is based on multiple scan chains. We propose new compression architecture with fixed length for running tests. In results, when the complexity of a VLSI circuit is growing, the number of input pins for testing is very low. Since test data in power aware is not changed frequently, we use a selector to filter the unnecessary status and buffers to hold the back data. We also propose a new algorithm to assign multiple scan chains and an improved linear dependency comp
2 99/2 電機系 饒建奇 副教授 期刊論文 發佈 Power-aware compression scheme for multiple scan-chain , [99-2] :Power-aware compression scheme for multiple scan-chain期刊論文Power-aware compression scheme for multiple scan-chainRau, Jiann-Chyi; Wu, Po-Han淡江大學電機工程學系scan based testing; low power testing; test data compression; design for testability (DfT)Abingdon: Taylor & Francis Ltd.Journal of the Chinese Institute of Engineers 34(4), pp.515-527As test data continues to grow quickly, test cost also increases. For the sake of decreasing the test cost, this article presents a new data dependency compression scheme for large circuit which is based on multiple scan chains. We propose new compression architecture with fixed length for running tests. In results, when the complexity of a VLSI circuit is growing, the number of input pins for testing is very low. Since test data in power aware is not changed frequently, we use a selector to filter the unnecessary status and buffers to hold the back data. We also propose a new algorithm to assign multiple scan chains and an improved linear dependency comp
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