關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Planning step-stress test under Type-I censoring for the exponential case

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1 102/2 數學系 林千代 教授 期刊論文 發佈 Planning step-stress test under Type-I censoring for the exponential case , [102-2] :Planning step-stress test under Type-I censoring for the exponential case期刊論文Planning step-stress test under Type-I censoring for the exponential caseLin, Chien-Tai; Chou, Cheng-Chieh; N. Balakrishnan淡江大學數學學系accelerated life; censored data; distributed computations; maximum likelihood; optimization; reliabilityAbingdon: Taylor & FrancisJournal of Statistical Computation and Simulation 84(4), pp.819-832Published online: 22 Oct 2012. NSC 99-2118-M-032-011-MY3We consider in this work a k-level step-stress accelerated life-test (ALT) experiment with unequal duration steps τ=(τ1, …, τk). Censoring is allowed only at the change-stress point in the final stage. An exponential failure time distribution with mean life that is a log-linear function of stress, along with a cumulative exposure model, is considered as the working model. The problem of choosing the optimal τ is addressed using the variance-optimality criterion. Under this setting, we then show that the optimal k-level step-stress AL
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