關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process

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序號 學年期 教師動態
1 103/2 數學系 蔡志群 副教授 期刊論文 發佈 Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process , [103-2] :Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process期刊論文Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener ProcessTsai, Chih-Chun; Lin, Chien-Tai; Narayanaswamy, BalakrishnanCost function;optimal accelerated-stress acceptance testing time;optimal test plan;parameter misspecification;quality;characteristic;sensitivity analysisIEEE Transactions on Reliability 64(2), pp.603-612Acceptance testing is widely used to assess whether a product meets the expectations of customers. Yet, traditional acceptance tests based on time-to-failure data will not be practical because today's highly reliable products may take a long time to fail. It may be good in this case to base a test on a suitable quality characteristic (QC) whose degradation over time is related to the reliability of the product. Motivated by resistor data, we first propose a degradation model to describe the degradation paths of the resistors. Next, we present an accelerated-stress acceptan
2 103/2 數學系 林千代 教授 期刊論文 發佈 Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process , [103-2] :Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process期刊論文Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener ProcessTsai, Chih-Chun; Lin, Chien-Tai; Narayanaswamy, BalakrishnanCost function;optimal accelerated-stress acceptance testing time;optimal test plan;parameter misspecification;quality;characteristic;sensitivity analysisIEEE Transactions on Reliability 64(2), pp.603-612Acceptance testing is widely used to assess whether a product meets the expectations of customers. Yet, traditional acceptance tests based on time-to-failure data will not be practical because today's highly reliable products may take a long time to fail. It may be good in this case to base a test on a suitable quality characteristic (QC) whose degradation over time is related to the reliability of the product. Motivated by resistor data, we first propose a degradation model to describe the degradation paths of the resistors. Next, we present an accelerated-stress acceptan
[第一頁][上頁]1[次頁][最末頁]目前在第 1 頁 / 共有 02 筆查詢結果