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1 98/1 統計系 蔡宗儒 教授 期刊論文 發佈 Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test , [98-1] :Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test期刊論文Evaluation of the Mean Life of LEDs under the Accelerated Degradation TestTsai, Tzong-Ru; Lin, Chin-Wei; Chen, Chiu-Ling; Huang, Sheng-Bang淡江大學統計學系Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener ProcessKumamoto: ICIC InternationalICIC Express Letters 3(4)pt.B, pp.1471-1476This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers.tku_id: 000078031;Submitted by 數位組工讀生 (deer+std@mail.tku.edu.tw) on 2013-07-15T02:04:46Z No. of bitstreams: 0;Made available in DSpace on 2013-07-15T02:04:47Z (GMT). No. of b
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