關鍵字查詢 | 類別:期刊論文 | | 關鍵字:Discordancy tests for two-parameter exponential samples

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序號 學年期 教師動態
1 103/2 數學系 林千代 教授 期刊論文 發佈 Discordancy tests for two-parameter exponential samples , [103-2] :Discordancy tests for two-parameter exponential samples期刊論文Discordancy tests for two-parameter exponential samplesChien-Tai Lin; Shih-Chun WangCritical values;Masking effect;Sequential testing;Spacings;Swamping effectStatistical Papers 56(2), p.569-582The inside-out sequential procedures for testing up to k upper outliers in a two-parameter exponential sample are investigated. Six test statistics, one based on the ratio of the difference of largest observation and the sample mean which are unsuspected to be outliers to the range of these observations, and others used for block test procedures discussed in Basu (J Am Stat Assoc 60:548–559, 1965), Balasooriya and Gadag (J Stat Comput Simul 50:249–259, 1994), Zerbet and Nikulin (Commun Stat Theory Methods 32:573–583, 2003) and Kumar (Testing for suspected observations in an exponential sample with unknown origin, 2013), are considered. Utilizing the recursion of Huffer (J Appl Probab 25:346–354, 1988) and algorithm of Lin and Balakrishnan
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