教師資料查詢 | 類別: 專利 | 教師: 王建凱 Chien-Kai Wang (瀏覽個人網頁)

標題:System and Method for Measuring Distribution of Deformation using Atomic Force
學年104
學期2
專利開始日期2016/06/21
專利結束日期1900/01/01
作品名稱System and Method for Measuring Distribution of Deformation using Atomic Force
作品名稱(其他語言)
著者Bong Kyun Jang, Jae-Hyun Kim, Hak-Joo Lee, Kyung-Suk Kim, Chien-Kai Wang
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著錄名稱、卷期、頁數
描述
摘要The present invention relates to an apparatus to measure distribution of deformation using an atomic force to measure a deformation rate of atomic scale with high resolution at low costs. The apparatus comprises: a laser light source which generates a laser beam; a first cantilever and a second cantilever close to a measurement sample or a reference sample to generate deformation due to an atomic force; an optical system which successively reflects the laser beam on the first cantilever and the second cantilever, controlling an optical path of the laser beam to arrange the first cantilever and the second cantilever in a position of a store; an observation part which observes the laser beam reflected on the second cantilever; and a stage placed on the measurement sample or the reference sample, moving to three axial directions of X, Y, and Z.COPYRIGHT KIPO 2016
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