教師資料查詢 | 類別: 會議論文 | 教師: 蔡宗儒 TZONG-RU TSAI (瀏覽個人網頁)

標題:Study for Reaching a Degradation Test Plan
學年104
學期2
發表日期2016/03/26
作品名稱Study for Reaching a Degradation Test Plan
作品名稱(其他語言)
著者Tsai, Tzong-Ru; Lio, Y. L.
作品所屬單位
出版者
會議名稱The 4th IIAE International Conference on Industrial Application Engineering 2016
會議地點Beppu, Japan
摘要In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm.
關鍵字Brownian motion process;Gamma process;geometric Brownian motion process;generalized Eyring model;inverse Gaussian distribution
語言英文
收錄於
會議性質國際
校內研討會地點
研討會時間20160326~20160330
通訊作者Tsai, Tzong-Ru
國別日本
公開徵稿
出版型式
出處Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016
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