CGIN: a fault tolerant modified Gamma interconnection network
學年 85
學期 1
出版(發表)日期 1996-12-01
作品名稱 CGIN: a fault tolerant modified Gamma interconnection network
作品名稱(其他語言)
著者 莊博任; Chuang, Po-jen
單位 淡江大學電機工程學系
出版者 Piscataway: Institute of Electrical and Electronics Engineers (IEEE)
著錄名稱、卷期、頁數 IEEE Transactions on Parallel and Distributed Systems 7(12), pp.1301-1306
摘要 To improve the terminal reliability of the Gamma interconnection network (GIN), we consider altering its connecting patterns between stages to attain multiple disjoint paths between any source and destination pair. The new modified GIN, referred to as a CGIN with connecting patterns between stages exhibiting a cyclic feature, is able to tolerate any arbitrary single fault and to lift up terminal reliability accordingly. If several rows of switching elements are fabricated in one chip using the VLSI technology, a CGIN could lead to reduced cost because the pin count per chip decreases and the layout area taken by connections shrinks. To make routing and rerouting in the CGIN more efficient and simpler to implement, destination tag routing and rerouting is also provided
關鍵字
語言 en
ISSN 1045-9219
期刊性質 國外
收錄於
產學合作
通訊作者
審稿制度
國別 USA
公開徵稿
出版型式 電子版
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