專書單篇
| 學年 | 106 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2017-09-01 |
| 作品名稱 | A survey of modeling and application of non-destructive and destructive degradation tests |
| 作品名稱（其他語言） | |
| 著者 | Tsai, C. C.; Lin, C. T.; Balakrishnan, N. |
| 單位 | |
| 出版者 | Springer Singapore |
| 著錄名稱、卷期、頁數 | Statistical Modeling for degradation data |
| 摘要 | These days, most products are highly reliable which makes it very difficult or even impossible to obtain failure data on such products within a reasonable period of time prior to product release. Degradation tests are one way to overcome this obstacle by collecting degradation data (measurement of degradation) on such products. Based on different measurement processes, degradation tests can be divided into non-destructive and destructive degradation tests. In this chapter, we discuss a number of these two types of degradation models that have been developed in the literature to describe the degradation paths of products. In addition, some applications of degradation models of these two classes are also discussed. |
| 關鍵字 | Highly reliable products;Quality characteristics;Degradation data;Linearized and nonlinear degradation paths |
| 語言 | en_US |
| ISBN | 978-981-10-5193-7 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/112922 ) |