期刊論文
| 學年 | 98 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2009-12-01 |
| 作品名稱 | Optimal step-stress accelerated degradation test plan for gamma degradation processes |
| 作品名稱（其他語言） | |
| 著者 | Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun |
| 單位 | 淡江大學數學學系 |
| 出版者 | IEEE Reliability Society |
| 著錄名稱、卷期、頁數 | IEEE Transactions on Reliability 58(4), pp.611-618 |
| 摘要 | Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more appropriately modeled by a gamma process which exhibits a monotone increasing pattern. Hence, in practice, designing an efficient SSADT plan for a gamma degradation process is of great interest. In this paper, we first introduce the SSADT model when the degradation path follows a gamma process. Next, under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings such as sample size, measurement frequency, and termination time are obtained by minimizing the approximate variance of the estimated MTTF of the lifetime distribution of the product. Finally, an example is presented to illustrate the proposed method. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 0018-9529 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 是 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | 紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/58134 ) |