期刊論文

標題 A New Measure of Cluster Validity Using Line Symmetry
學年 102
學期 2
出版(發表)日期 2014/02/01
作品名稱 A New Measure of Cluster Validity Using Line Symmetry
作品名稱(其他語言)
著者 Chou, Chien-Hsing; Hsieh, Yi-Zeng; Su, Mu-Chun
單位 淡江大學電機工程學系
出版者 Taipei: Institute of Information Science
著錄名稱、卷期、頁數 Journal of Information Science and Engineering 30(2), pp.443-461
摘要 Many real-world and man-made objects are symmetry, therefore, it is reasonable to assume that some kind of symmetry may exist in data clusters. In this paper a new cluster validity measure which adopts a non-metric distance measure based on the idea of "line symmetry" is presented. The proposed validity measure can be applied in finding the number of clusters of different geometrical structures. Several data sets are used to illustrate the performance of the proposed measure.
關鍵字 cluster validity;clustering algorithm;line symmetry;cluster analysis;similarity measure;unsupervised learning
語言 英文(美國)
ISSN 1016-2364
期刊性質 國外
收錄於 SCI;EI;
產學合作
通訊作者 Su, Mu-Chun
審稿制度
國別 中華民國
公開徵稿
出版型式 ,電子版,紙本