期刊論文
| 學年 | 93 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2004-08-01 |
| 作品名稱 | X-ray absorption spectroscopy (XAS) study of dip deposited a-C:H(OH) thin films |
| 作品名稱（其他語言） | |
| 著者 | Ray, S.C.; Tsai, H.M.; Chiou, J.W.; Bose, B.; Jan, J.C.; Kumar, Krishna; Pong, W.F.; Dasgupta D.; Tsai, M. H. |
| 單位 | 淡江大學物理學系 |
| 出版者 | Temple Way: Institute of Physics (IOP) |
| 著錄名稱、卷期、頁數 | Journal of Physics Condensed Matter 16(32), pp.5713-5719 |
| 摘要 | This work measures the C and O K-edge x-ray absorption near-edge structure (XANES) spectra of hydrogenated amorphous carbon (a-C:H) films deposited at various baking temperatures Tb (Tb = 300–500 °C at 50 °C). The C–H σ* peak related to the content of the sp2 graphite-like bonding in the C K-edge spectra was found to yield to the C–H π* peak related to the sp3 diamond-like bonding at high temperature (500 °C). We find that the intensities of both the sp2 and sp3 features in the C K-edge XANES spectra decrease with increase of Tb, which suggests an increase of the defect concentration with Tb. The intensities of the O K-edge XANES spectra are found to decrease with increase of Tb, which suggests thermally induced decomposition of carbonyl contaminants on the surface. The elemental analysis C/O (or O/C) ratio was obtained from XPS spectra and indicates that films are not hydrogenated amorphous carbon but rather oxyhydrogenated amorphous carbon thin films. |
| 關鍵字 | Absorption spectroscopy; Carbon; Decomposition; Friction; High temperature effects; Hydrogenation; X ray photoelectron spectroscopy; X ray spectroscopy; Carbon phases; X-ray absorption near-edge structures (XANES); X-ray absorption spectroscopy (XAS); Thi |
| 語言 | en |
| ISSN | 0953-8984 |
| 期刊性質 | 國外 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | Ray, S.C. |
| 審稿制度 | |
| 國別 | GBR |
| 公開徵稿 | |
| 出版型式 | 紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27615 ) |