期刊論文

學年 95
學期 2
出版(發表)日期 2007-04-01
作品名稱 Using essential patent index and essential technological strength to evaluate industrial technological innovation competitiveness
作品名稱(其他語言)
著者 Chen, Dar-zen; Lin, Wen-yau Cathy; Huang, Mu-Hsuan
單位 淡江大學資訊與圖書館學系
出版者 Springer
著錄名稱、卷期、頁數 Scientometrics 71(1), p.101-116
摘要 The aim of this article is to develop new patent indicators for evaluating technological innovation competitiveness between companies. A novel indicator representing an industrial's patent performance, Essential Patent Index (EPI), was developed by incorporating information on who cited these patents and when these patents were cited, based on the assumption that both contribute to meaningful quality assessment. By combining EPI and Chi's well known Technological Strength (TS) indicator, a second novel indicator Essential Technological Strength (ETS) was developed to represent the innovation competitiveness of an individual company. In this study, patent performance of three high-tech industries in Taiwan were analyzed using ETS as well as the traditional TS for comparison. Results from this analysis demonstrated that ETS provided better insights by clearly verifying the latent influence of citations, reinforcing the impact of essential patents, and aggrandizing the differences of innovation competitiveness between companies.
關鍵字 Patent Citation;Patent Indicator;Patent Quality;Global Competitiveness Report;Utility Patent
語言 en
ISSN 0138-9130
期刊性質 國外
收錄於 SCI SSCI
產學合作
通訊作者 Huang, Mu-hsuan
審稿制度
國別 HUN
公開徵稿
出版型式 ,電子版,紙本
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