期刊論文
| 學年 | 100 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2012-03-01 |
| 作品名稱 | Planning step-stress test plans under Type-I censoring for the log-location-scale case |
| 作品名稱（其他語言） | |
| 著者 | Lin, Chien-Tai; Chou, Cheng-Chieh; Balakrishnan, N. |
| 單位 | 淡江大學數學學系 |
| 出版者 | Abingdon: Taylor & Francis |
| 著錄名稱、卷期、頁數 | Journal of Statistical Computation and Simulation 83(10), pp.1852-1867 |
| 摘要 | In this paper, we consider a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps τ=(τ1, …, τ k ). Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice of τ for both Weibull and lognormal distributions are addressed using the variance–optimality criterion. Numerical results show that for a general log-location-scale distributions, the optimal k-step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model. |
| 關鍵字 | accelerated life;reliability;censored data;distributed computations;Weibull and similar distributions;maximum likelihood;optimization |
| 語言 | en_US |
| ISSN | 1563-5163 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | Lin, Chien-tai |
| 審稿制度 | 否 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/77037 ) |