期刊論文
| 學年 | 99 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2011-01-01 |
| 作品名稱 | Nano-scale chemical imaging of a single sheet of reduced graphene oxide |
| 作品名稱（其他語言） | |
| 著者 | Zhou, J. G.; Wang, J.; Sun, C. L.; Maley, J. M.; Sammynaiken, R.; Sham, T. K.; Pong, W. F. |
| 單位 | 淡江大學物理學系 |
| 出版者 | Cambridge: Royal Society of Chemistry |
| 著錄名稱、卷期、頁數 | Journal of Materials Chemistry 21(38), pp.14622-14630 |
| 摘要 | Scanning transmission X-ray microscopy (STXM) has been used to chemically image single and multiple layers of a thermally reduced graphene oxide (r-GO) multi-layer sheet of the size of 1 μm and a thickness of 5 nm. The thickness of individual layers in the single sheet can be identified through quantitative analysis of STXM. The local electronic and chemical structure of interest (edge versus center) in different regions within the single r-GO sheet has been studied by C K-edge X-ray absorption near edge structure spectroscopy (XANES) with 30 nm spatial resolution. High and localized unoccupied densities of states (DOS) of carbon σ* character were observed in r-GO compared to graphite and were interpreted as the lack of strong layer to layer interaction in the former. The azimuthal dependence of C K-edge XANES in selected locations has also been obtained and was used to infer the preferred edge structure. The r-GO sample was also characterized by TEM, AFM and Raman spectroscopy; the findings are in good accord with the STXM results. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 0959-9428 1364-5501 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | Zhou, J. G. |
| 審稿制度 | |
| 國別 | GBR |
| 公開徵稿 | |
| 出版型式 | 紙本 電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72646 ) |