期刊論文
| 學年 | 79 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 1991-06-15 |
| 作品名稱 | Spectroscopic ellipsometry studies of YBa2Cu3O7− deposited on SrTiO3 |
| 作品名稱（其他語言） | |
| 著者 | Sengupta, L. C.; Huang, D.; Roughani, B. J.; Aubel, L.; Sundaram, S.; 張經霖; Chang, C. L. |
| 單位 | 淡江大學物理學系 |
| 出版者 | American Institute of Physics (AIP) |
| 著錄名稱、卷期、頁數 | Journal of Applied Physics 69(12), pp.8272-8276 |
| 摘要 | The dielectric function E = e1 - ieZ of the YBa&u,O, _ a high-TT, superconducting fdms grown on (100) SrTiO, (c-axis oriented) and (110) SrTiO, (&oriented) substrate was measured by spectroscopic polarization modulation ellipsometry (SPME) and changes in film orientation were studied by comparing films of various thicknesses. The films deposited on SrTiO, (100) substrates demonstrated an isotropic e1 that changed with film thickness. It is observed that the decrease in the metallic dielectric behavior associated with the increase in the thickness of the films grown on (100) SrTi03 substrates is mainly due to a change in the orientation of the films. The films deposited on SrTiO, (110) showed anisotropic dielectric behavior when the plane of polarization is parallel and perpendicular to the c-axis of the film. These studies show that for this high-temperature superconductor with anisotropic dielectric. behavior, SPME is a highly sensitive technique capable of measuring small changes in the film orientation. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 0021-8979 |
| 期刊性質 | 國內 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | |
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| 公開徵稿 | |
| 出版型式 | 紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27541 ) |