期刊論文
| 學年 | 92 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2004-05-03 |
| 作品名稱 | Electronic structure of ZnO nanorods studied by angle-dependent x-ray absorption spectroscopy and scanning photoelectron microscopy |
| 作品名稱（其他語言） | |
| 著者 | Chiou, J. W.; Jan, J. C.; Tsai, H. M.; Bao, C. W.; Pong, W. F.; Tsai, M. H.; Hong, I. H.; Klauser, R.; Lee, J. F.; Wu, J. J.; Liu, S. C. |
| 單位 | 淡江大學物理學系 |
| 出版者 | College Park: American Institute of Physics (AIP) |
| 著錄名稱、卷期、頁數 | Applied Physics Letters 84(18), pp.3462-3464 |
| 摘要 | Angle-dependent x-ray absorption near-edge structure (XANES) and scanning photoelectron microscopy measurements were performed to differentiate local electronic structures at the tips and sidewalls of highly aligned ZnO nanorods. The overall intensity of the O K-edge XANES spectra is greatly enhanced for small photon incident angles. In contrast, the overall intensity of the Zn K-edge XANES is much less sensitive to the photon incident angle. Both valence-band photoemission and O K-edge XANES spectra show substantial enhancement of O 2p derived states near the valence band maximum and conduction band minimum, respectively. The spatially resolved Zn 3d core level spectra from tip and sidewall regions show the lack of chemical shift. All the results consistently suggest that the tip surfaces of the highly aligned ZnO nanorods are terminated by O ions and the nanorods are oriented in the [0001¯] direction. © 2004 American Institute of Physics. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 0003-6951 1077-3118 |
| 期刊性質 | 國外 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | Pong, W. F. |
| 審稿制度 | |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | 紙本 電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27596 ) |